OGI Systems Has New High Resolution-Non Contact Optical Scanner for GIA Instruments
Tue, June 06 2006, 10:52 EST

OGI Systems of Israel has designed a new, high resolution, non contact optical scanner for polished diamonds exclusively for GIA Instruments. OGI experienced success with it`s implementation of the rough planning systems embedded with GIA Facetware which supports the GIA cut grading system.
Daniel Ben Zano, President of OGI Systems, says "OGI has invested substantial resources to develop a new, high resolution Cut Proportion Analyzer. We are technically proud to have designed software and hardware technology, specific to the needs of GIA Instruments for the global diamond market."
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